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Book Information
540 pages • paperback • 6 editions
ISBN/UID: 9783642068706
Format: Paperback
Language: English
Publisher: Springer
Edition Pub Date: 19 Oct 2010
Description
The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments...
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Content Warnings
540 pages • paperback
ISBN/UID: 9783642068706
Format: Paperback
Language: English
Publisher: Springer
Edition Pub Date: 19 Oct 2010
Description
The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments...
Community Reviews
Content Warnings