Electro-Thermal Simulation Studies of Sic Junction Diodes Containing Screw Dislocations Under High Reverse-Bias Operation by National Aeronautics and Space Adm Nasa

Electro-Thermal Simulation Studies of Sic Junction Diodes Containing Screw Dislocations Under High Reverse-Bias Operation

National Aeronautics and Space Adm Nasa

38 pages • missing pub info (view editions)

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The objective of this work was to conduct a modeling study of SiC P-N junction diodes operating under high reverse biased conditions. Analytical models and numerical simulation capabilities were to be developed for self-consistent electro-thermal ...

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