Take a photo of a barcode or cover
212 pages • missing pub info (view editions)
ISBN/UID: 9780792393528
Format: Hardcover
Language: English
Publisher: Springer
Edition Pub Date: Not specified
Description
As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluation of long-term reliability of MOS VLSI circuits is becoming an important problem. The assessment and improvement of reliability on the circuit level...
Community Reviews
Content Warnings
212 pages • missing pub info (view editions)
ISBN/UID: 9780792393528
Format: Hardcover
Language: English
Publisher: Springer
Edition Pub Date: Not specified
Description
As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluation of long-term reliability of MOS VLSI circuits is becoming an important problem. The assessment and improvement of reliability on the circuit level...
Community Reviews
Content Warnings