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Book Information
540 pages • hardcover • 6 editions
ISBN/UID: 9783540319146
Format: Hardcover
Language: English
Publisher: Springer
Edition Pub Date: 10 Apr 2006
Description
The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments...
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Content Warnings
540 pages • hardcover
ISBN/UID: 9783540319146
Format: Hardcover
Language: English
Publisher: Springer
Edition Pub Date: 10 Apr 2006
Description
The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments...
Community Reviews
Content Warnings